Fluorescence interference structured illumination microscopy for 3D morphology imaging with high axial resolution

Authors:

Yile Sun, Hongfei Zhu, Lu Yin, Hanmeng Wu, Mingxuan Cai, Weiyun Sun, Yueshu Xu, Xinxun Yang, Jiaxiao Han, Wenjie Liu, Yubing Han, Xiang Hao, Renjie Zhou, Cuifang Kuang, Xu Liu

Keywords:

fluorescence interference structured illumination microscopy, FI-SIM, 3D

Abstract:

Imaging three-dimensional, subcellular structures with high axial resolution has always been the core purpose of fluorescence microscopy. However, trade-offs exist between axial resolution and other important technical indicators, such as temporal resolution, optical power density, and imaging process complexity. We report a new imaging modality, fluorescence interference structured illumination microscopy (FI-SIM), which is based on three-dimensional structured illumination microscopy for wide-field lateral imaging and fluorescence interference for axial reconstruction. FI-SIM Moreover, the relatively low laser power density relaxes the requirements for dyes and enables a wide range of applications for observing fixed and live subcellular structures.

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