Super-resolution fluorescence microscopy

Authors:

Mondal, P. P., & Diaspro, A.

Keywords:

Bessel Beam, Evanescent Field, Total Internal Reflection Fluorescence, Total Internal Reflection, Fluorescence Microscopy, Aperture Function

Abstract:

This chapter is dedicated to a general overview of some of the emerging and well-established super-resolution techniques recently developed. Examples include both so called near-field and far-field fluorescence imaging techniques. Near field is essentially related to evanescent field based techniques such as, TIRF and its variants. Far-field techniques include, STED, SIM, 4Pi and localization techniques (PALM, fPALM, STORM), even if most of the games takes place at the molecular level. This chapter also includes imaging techniques (SPIM, IML-SPIM etc.) that employ selective plane illumination rather than a point-by-point illumination. The final section is dedicated to the generation of Bessel beam and MESO microscopy that is capable of generating multiple excitation spots.

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